Download (pdf)Prod. Index 300KB

dr.schwab GmbH: Product Index

dr.schwab Inspection Technology GmbH develops and produces inspection systems to support optical disc production: a unique range of off-line and in-line systems to monitor, control and optimise every stage of the production process - from glass master to finished disc - for all formats.

Only dr.schwab GmbH offers such a comprehensive range of inspection systems and measurement features, enabling you to get the very best from your mastering, stamper forming and replication processes.

This page outlines key features of dr.schwab GmbH's current product range.

For further information about each product, please download the product leaflet or White Paper, or contact us

Mastering and stamper forming: DOMSXE-blu

The all-in-one inspection system covering the entire mastering quality control process at every stage through to finished discs.
DOMSXE-blu
Diffraction Order Measurement System
DOMS XE-blu
Download (pdf):
Leaflet 100KB White Paper 300KB
Glass masters, stampers, replicas: all formats
  • Monitors the process from the very first step to avoid producing substandard stampers and discs
  • Unique combination of blue laser diffraction order measurement, spectrometer and CCD camera
  • Comprehensive defect detection: large, low-contrast defects identified by diffraction order measurement; small, high-contrast defects detected by camera
  • Evaluates groove profile - including clouding - with AFM-comparable accuracy; unlike AFM, covers the entire surface of the sample within a short cycle time
  • Evaluates photo resist layer on all master types, including PTM on glass and wafer, for coatings 10nm - 600nm thick
  • Camera module checks stamper eccentricity and verifies barcodes

Mastering: stratos

Highly accurate evaluation of very thin photo resist layers.
Stamper Tester
based on IQPC
stamper
Download (pdf):
White Paper 400KB
Stampers
  • Saves time and money: identifies defects BEFORE the stamper is used in replication
  • High-resolution line-scan camera detects all relevant stamper defects, including inner area
  • Detects acceleration defects such as bumps
  • Evaluates stamper eccentricity
  • Barcode recognition

Replication: argusXE

Forward-looking off-line process control and optimisation
argusXE
Universal Disc Measurement System
argusxe
Download (pdf):
Leaflet 100KB White Paper 800KB
Substrates, half-discs, finished discs: All formats, including HD-DVD and Blu-ray Disc

Basics
  • Modular system with red/green or blue laser module, available for all disc types and needs
  • Intuitive Windows XP® software includes extensive data storage and export functions
  • Compact, quick, precise, reliable, easy to use

Main Advantages
  • All measurements according to specs (e.g. disc temperature, blue 405nm laser for BD/HD laser measurements)
  • High precision space and cover layer thickness measurement with proprietary high-speed high-resolution spectrometer
  • Outstanding high local resolution at critical outer layer edges
  • Advanced process analysis: trend function, database for comparison with earlier measurements or comparison of different lines

Replication: IQPCblu

Advanced in-line inspection for all current and future formats, at every key stage of replication
IQPCblu
Integrated Quality and Process Control System
IQPC
Download (pdf):
Leaflet 200KB White Paper 400KB
Substrate, dye and final scanners: all formats including dual layer recordable DVD, HD-DVD and Blu-ray Disc
  • More than just a quality assurance tool: outstanding measurement performance plus advanced statistical analysis to support process optimisation
  • Individual data processors working in parallel allow exceptionally complex - but fast - evaluation, eg: accurate surface defect classification; unique outer edge inspection; inspection in the transparent inner disc area
  • Genuine inner area inspection by camera - not just by sensor - includes detection of cracks and local defects, resin shortage or overflow, and unique in-line eccentricity check
  • Safeguards against focus errors: 8-radius tilt measurement for global deformation; near darkfield inspection for local acceleration defects
  • Detects positions of the outer edges of groove area, dye layer and sputter layer to ensure that the data area is completely covered

Product leaflets and White Papers are available in hardcopy or on CD:
please contact us to request a copy.