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dr.schwab Inspection Technology GmbH develops and produces inspection systems to support optical disc production: a unique range of off-line and in-line systems to monitor, control and optimise every stage of the production process - from glass master to finished disc - for all formats.
Only dr.schwab GmbH offers such a comprehensive range of inspection systems and measurement features, enabling you to get the very best from your mastering, stamper forming and replication processes.
This page outlines key features of dr.schwab GmbH's current product range.
For further information about each product, please download the product leaflet or White Paper, or contact us
Mastering and stamper forming: DOMSXE-blu
The all-in-one inspection system covering the entire mastering quality control process at every stage through to finished discs. |
DOMSXE-blu Diffraction Order Measurement System
 Download (pdf): Leaflet 100KB White Paper 300KB | Glass masters, stampers, replicas: all formats - Monitors the process from the very first step to avoid producing substandard stampers and discs
- Unique combination of blue laser diffraction order measurement, spectrometer and CCD camera
- Comprehensive defect detection: large, low-contrast defects identified by diffraction order measurement; small, high-contrast defects detected by camera
- Evaluates groove profile - including clouding - with AFM-comparable accuracy; unlike AFM, covers the entire surface of the sample within a short cycle time
- Evaluates photo resist layer on all master types, including PTM on glass and wafer, for coatings 10nm - 600nm thick
- Camera module checks stamper eccentricity and verifies barcodes
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Mastering: stratos
Highly accurate evaluation of very thin photo resist layers. |
Stamper Tester based on IQPC
 Download (pdf): White Paper 400KB | Stampers - Saves time and money: identifies defects BEFORE the stamper is used in replication
- High-resolution line-scan camera detects all relevant stamper defects, including inner area
- Detects acceleration defects such as bumps
- Evaluates stamper eccentricity
- Barcode recognition
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Replication: argusXE
Forward-looking off-line process control and optimisation
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argusXE Universal Disc Measurement System
 Download (pdf): Leaflet 100KB White Paper 800KB | Substrates, half-discs, finished discs: All formats, including HD-DVD and Blu-ray Disc Basics- Modular system with red/green or blue laser module, available for all disc types and needs
- Intuitive Windows XP® software includes extensive data storage and export functions
- Compact, quick, precise, reliable, easy to use
Main Advantages- All measurements according to specs (e.g. disc temperature, blue 405nm laser for BD/HD laser measurements)
- High precision space and cover layer thickness measurement with proprietary high-speed high-resolution spectrometer
- Outstanding high local resolution at critical outer layer edges
- Advanced process analysis: trend function, database for comparison with earlier measurements or comparison of different lines
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Replication: IQPCblu
Advanced in-line inspection for all current and future formats, at every key stage of replication
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IQPCblu Integrated Quality and Process Control System
 Download (pdf): Leaflet 200KB White Paper 400KB | Substrate, dye and final scanners: all formats including dual layer recordable DVD, HD-DVD and Blu-ray Disc - More than just a quality assurance tool: outstanding measurement performance plus advanced statistical analysis to support process optimisation
- Individual data processors working in parallel allow exceptionally complex - but fast - evaluation, eg: accurate surface defect classification; unique outer edge inspection; inspection in the transparent inner disc area
- Genuine inner area inspection by camera - not just by sensor - includes detection of cracks and local defects, resin shortage or overflow, and unique in-line eccentricity check
- Safeguards against focus errors: 8-radius tilt measurement for global deformation; near darkfield inspection for local acceleration defects
- Detects positions of the outer edges of groove area, dye layer and sputter layer to ensure that the data area is completely covered
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